Test y Medida para Comunicaciones — España
SWS2000 and OMNI (PDF, 1.01 MB)
The Swept Wavelength System SWS2000 series remains the industry standard solution for measuring insertion loss (IL), polarization dependent loss (PDL), return loss (RL) and directivity with high wavelength resolution in both research and development (R&D) and production environments. With the OMNI Expansion group delay (GD) and differential group delay can be added making SWS the ideal system for the complete verification of components for 40G systems.
Currently used at more than 80 customer sites,with over 8500 detector channels deployed, the SWS test platform validates optical performance for the latest in optical components and modules including: ROADMs, Wavelength Switches, Tunable Filters and Circuit Packs. The SWS system consists of a tunable laser source, a source optics module (SOM), a control module, a receiver chassis, one or more detector modules and application software.
With a ± 0.002 nm absolute wavelength accuracy over the entire 1420 to 1630 nm range, a high sweep speed of 40 nm/s, and a deep dynamic range of > 70 dB, the SWS2000 provides excellent performance combined with a low cost of ownership; the distributed architecture supports up to eight separate, individually controlled measurement stations per source laser. Often purchased initially as an R&D tool, this scalability in the number of measurement stations provides customers the flexibility to transition the equipment from R&D to production.
Upgrade packages from legacy SWS systems to the SWS2000 platform are available to ensure that existing SWS users receive the maximum benefit from their existing capital infrastructure.
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