The JDSU Multiple Application Platform (MAP-200) is an optical test and measurement platform optimized for cost-effective development and manufacturing of optical transmission network elements. Today's rapidly changing optical market requires investment in productivity-enhancing technologies and tools, making the MAP-200 scalable test platform the right tool needed in even the most stringent environments.

Based on the previous-generation Multiple Application Platform (MAP), the MAP-200 builds on the differentiation of offering the broadest portfolio of modules in the densest and most configurable platform. The MAP-200 is optimized for test applications in lab and manufacturing environments ranging from insertion loss testing to dispersion penalty testing.

Applications

• Enables transceiver and transponder testing
• Permits comprehensive passive and active component, laser, and ampli­fier testing
• Facilitates 10 G and 40 G system and subsystem testing
• MAP Broadband Source
• MAP Erbium-Doped Fiber Amplifier
• MAP Fabry-Perot Laser
• MAP Large Channel Count Switch
• MAP Light Emitting Diode Source
• MAP Insertion Loss and Return Loss Test Modules
• MAP Polarization Controller
• MAP Optical Power Meter
• MAP Small Channel Count Switch
• MAP Swept Wavelength Test System
• MAP Tunable Filter
• MAP Utility
• MAP Variable Backreflector
• MAP Variable Optical Attenuator
• MAP Tunable DBR Laser