Line Cards and Hardware Subsystems

JDSU offers dynamic test platforms that support test needs required at the line card and subsystem levels, including R&D board design and validation through interface conformance verification, with offset/eye diagram/jitter under various environmental conditions and checking all component interaction. JDSU also provides time and cost-effective production tests of boards and systems with repeatable and reliable results for up to 10 GigE, 40/43 G, 1 to 10 GFC, and an aggressive roadmap for 100 G/100 GigE.

ONT Optical Network Tester Family

Highly configurable, multi-application and multi-port platform for system verification and acceptance testing.

ONT-100G Test Solution Supporting 40GE/100GE/OTU4

The ONT-100G solution supports testing and verification for new high-speed network elements for 40GE and 100GE Ethernet. It allows the evaluation of the physical layer, PCS / MAC layers, and QoS testing at bit rates of 40GE and 100GE.

ONT-600 Multiport Test Module (MTM)

The MTM provides high density 155M to 11.1G testing at layers 1 through 3. Concurrent users can control a broad protocol range including OTN, GigE/10GigE LAN, and SONET/SDH.

TestPoint TS-10, TS-30 and TS-170

Modular chasses (three formats) for configuring interface types, transmission rates, protocols, and port density with support for multiple rates on a single port.

VOA and Power Meter Switch (VST)

Ideal integration of optical switching, attenuation, and power monitoring in a single, compact package from Polatis.