The DSn/PDH solution addresses the need of R&D and SVT labs to test boards and systems with combined transport technology and DSn/PDH services. It provides testing functionality for T-carrier and E-carrier signals including multiplex chains.
Highlights
- Single- and dual-port modules
- Independent ports
- Unframed, framed and multiplexed signals
- Mixed multiplexing E1 and DS1 in DS3
- Detailed event generation
- Status page with a view of all events
Applications
- Testing DSn/PDH signal interfaces
- Verifying correct DUT response on signal fault conditions
- Verifying multiplex chains
Key Features
- Two independent ports
- Unframed signals: 1.5, 2, 34, 45, and 139 Mbps
- Framed signals: E1, E3, E4, DS1, and DS3
- Multiplex chains: E1/E4, DS1/DS3, and mixed E1/DS1 in DS3
- Dynamic error/alarm generation